Test Advantage Software - Software for corporate test quality and efficiency standards for wafer mapping and the semiconductor industry

Welcome to Test Advantage Software

Mission Statement

Our mission is to deliver a comprehensive portfolio of innovative and non-intrusive integrated software solutions that provide the ability to increase the overall output of semiconductor device manufacturing at higher quality levels and with lower costs.

Test Advantage Software develops, and deploys leading-edge, proprietary software to automate manufacturing quality and facilitate equipment utilization and process improvements throughout the semiconductor back-end manufacturing process. Our solutions have repeatedly proven that no trade off is automatically necessary between device quality and the cost of test.

Technology attributes:

• Die grading and die disposition technology based on performance variability analysis of Wafer Fab and Test Data

• Wafer level disposition technology based on regional spatial and automatic pattern detection analysis

• End-to-end connectivity using open-standards enabling Adaptive Test and Adaptive feed-forward, Single Device Traceability (SDT) and Intelligent Recall through the Kinesys Test Advantage technology partnership.

• Corporate-wide test quality and efficiency standards throughout the semiconductor product lifecycle

Test Advantage Software patented and patent pending proprietary technologies exposes device marginality and enables next generation, feed-forward, adaptive test strategies, addressing the timely concern across the semiconductor industry as companies battle cost of test.

Our solutions provide the technology to enable downstream process flow decisions in order to optimize production strategy and cost.This is becoming even more critical as the industry drives toward the integration of known good die in 3D multi-chip packaging technologies.